Storage cell design evaluation circuit including a wordline timing and cell access detection circuit

ABSTRACT

A storage cell design evaluation circuit including a wordline timing and cell access detection circuit provides accurate information about state changes in static storage cells. A storage cell test row includes the access detection circuit, which provides the same loading during an access operation as the other cells in the array. The access detection circuit provides an output that may be probed without affecting the timing, read stability or writeability of the cell. The test row can test the clock and/or address timing of the row and may include a separate power supply rail for the row wordline driver, so that variation of access timing, read stability and writeability with wordline strength/access voltage can be determined. Multiple test rows may be cascaded among columns to provide a long delay line or ring oscillator for improved measurement resolution.

This application is a Continuation of U.S. patent application Ser. No. 11/609,598, filed on Dec. 12, 2006 by the same inventors and assigned to the same Assignee.

This invention was made with government support under DARPA, PERCSII, NBCH3039004. THE GOVERNMENT HAS CERTAIN RIGHTS IN THIS INVENTION.

BACKGROUND OF THE INVENTION

1. Technical Field

The present invention relates generally to memory design evaluation circuits, and more particularly to a memory circuit having a mimicking cell that accurately reflects internal state changes of a memory cell.

2. Description of the Related Art

Storage cell speed, circuit area and environmental operating ranges, e.g., supply voltage and temperature range, are critical limitations in today's processing systems and are predicted to become even more of a critical limitation as technologies move forward. In particular, static random access memory (SRAM) cells are used in processor caches and external storage to provide fast access to data and program instructions. Static storage cells are also used within processors and other digital circuits for storing values internally, for example, in processor registers.

With processor cycle frequencies reaching well above 4 Ghz, development of SRAM cells that can store and provide access to stored values within that period has become necessary. However, actually measuring the internal writeability and write timing margins of memory cells presents a challenge. In a typical storage cell, there is no mechanism for determining writeability and write timing margin, except for empirical evaluation performed by reading the cells after performing write operations under various conditions. If a probe is used to attempt to measure the internal result and timing of a write operation, the probe alters the timing of the cell, yielding incorrect results.

Memory cell transition times involving bitline read operations, sometimes in combination with write operations, have been evaluated using ring oscillator circuits or cascaded cell delay circuits wherein a large number of cells are cascaded. A ring oscillator may be formed with feedback of an output of the last cell to an input of the first cell, or a one-shot delay may be measured through the cascade of cells. The frequency at which the ring oscillator operates or the one-shot delay indicates the transition time performance, which provides some measure of ultimate operating frequency and access times. Typically, the cell design is then changed in subsequent design iterations having parameters adjusted in response to the results of the ring oscillator test.

However, present ring oscillator circuits and other delay-oriented circuits for performing delay tests typically either are not applied on production dies or they do not test the actual storage cells under wordline loading conditions identical to placement of the cells within an array. Further, write cycle measurements are not measured independently, since the inclusion of a cell in the oscillator ring or delay line requires that the cell value will be read in some manner to provide input to the next cell.

It is therefore desirable to provide a test circuit and method for accurately measuring wordline transition times under the complete row loading conditions of an actual array. It would further be desirable to measure access (pass) transistor drive time and internal write state/write timing of a storage cell under actual loading conditions. It is further desirable to provide such a test circuit that can be integrated within a production storage device.

SUMMARY OF THE INVENTION

The objective of accurately determining wordline timing including the effect of access transistor drive, as well as the internal written state/write timing of a storage cell design under actual loading conditions, is accomplished in a method and circuit.

The circuit replicates or is integrated within a row of a storage array. A special access timing detection cell is provided as one of the cells in the row, and includes loading circuits that duplicate the actual loading during at least one of the internal transitions of the storage cell in response to a write operation or other access operation. The overall timing is determined from an address input to the array to an output of the detection cell and the detection cells can be cascaded along one or more columns of the array to form a delay line or ring oscillator. The wordline loading of the cell can be made identical to that of an actual wordline.

The access detection cell is coupled to a row sense/output circuit, so that a low impedance output is be provided for measurement without altering the loading. The access detection cell may be formed from a modified 6T, or multiple-ported SRAM cell, in which one of the normally cross-coupled connections to one of the gate latch transistors is instead coupled to a properly-sized output probe drive transistor. The wordline driver may have a separate power supply, so that the required strength of the wordline driver and drive voltage can be evaluated. Evaluation can be made of write timing versus clock and/or address by fixing one of the clock or address signals and using the other as the stimulus signal, e.g., as the signal carrying the ring oscillator or delay line signal path in cascaded configurations.

The foregoing and other objectives, features, and advantages of the invention will be apparent from the following, more particular, description of the preferred embodiment of the invention, as illustrated in the accompanying drawings.

BRIEF DESCRIPTION OF THE DRAWINGS

The novel features believed characteristic of the invention are set forth in the appended claims. The invention itself, however, as well as a preferred mode of use, further objectives, and advantages thereof, will best be understood by reference to the following detailed description of an illustrative embodiment when read in conjunction with the accompanying drawings, wherein like reference numerals indicate like components, and:

FIG. 1A is a simplified schematic diagram of a memory cell test row in accordance with an embodiment of the invention.

FIG. 1B is a simplified schematic diagram of a reference memory cell test row in accordance with an embodiment of the invention.

FIG. 2 is a schematic diagram depicting details of sense circuit 12 of FIG. 1A, in accordance with an embodiment of the invention.

FIG. 3 is a schematic diagram depicting details of an access detection cell 20C that may be used to provide sense circuit 12 of FIG. 1A in accordance with another embodiment of the invention.

FIG. 4 is a schematic diagram depicting details of wordline drive circuit 14 of FIG. 1A.

FIG. 5 is a block diagram depicting a test memory array in accordance with an embodiment of the invention.

FIGS. 6A and 6B are time-voltage diagrams depicting signals within the memory cell test row of FIG. 1A.

FIG. 7 is a wafer test system in which a method according to the present invention is practiced.

DESCRIPTION OF ILLUSTRATIVE EMBODIMENT

The present invention concerns a test circuit for evaluating access performance of storage cells, e.g., registers or static memory cells, in order to facilitate design improvement and determination of operating and margins. The test circuit provides for characterizing wordline timing, including operation of access (pass) transistors under degraded drive conditions. A special sense circuit cell is incorporated into a row circuit and mimics the internal and external loading of a regular cell in an array. The sense circuit further provides an output that accurately reflects at least one of the state changes within the sense circuit cell caused by a write operation, so that write timing and writeability can be determined for an actual memory cell under actual operating conditions. Multiple rows in an array can be cascaded by connecting the output of the sensing circuit of each row to the wordline driver input of the next row to form a delay chain. The output of the last wordline can be connected to the first, to form a ring oscillator. The loading experienced by the cells in the oscillator is identical to that of an ordinary storage row, providing an accurate measure of the delays of the storage cells in an actual array implementation. A test die may be implemented that includes the test circuit permanently wired-in-place, or a sacrificial metal can be used to implement the circuit on a production wafer, which can then be modified into an operational circuit via a permanent metal layer that replaces the sacrificial layer. A storage array according to the present invention may also alternatively be implemented on the wafer kerf and discarded after testing. Alternatively, the ring oscillator or delay measurement circuit of the present invention can be selectively enabled in a test mode.

With reference now to the figures, and in particular with reference to FIG. 1A, a storage array row circuit in accordance with an embodiment of the invention is shown. A wordline drive circuit 14 receives a access strobe or clock signal Stb and an Address decode signal, as are generally provided for accessing a storage array row during a access operation. However, in the test operations as disclosed in further detail below, one of the Stb or Address decode signal may be set to a fixed (enabled) value so that the cell access timing with respect to the other signal, which is pulsed or included in a ring oscillator signal path. The wordline drive circuit receives two power supply rail inputs, a primary supply input V_(DD) and a wordline drive supply input V_(OD) for simulating a access overdrive voltage and/or determining whether or not overdrive is required. The output of the wordline drive circuit 14 is connected to a wordline that is either an actual storage array wordline, or is a test wordline that matches an actual storage array wordline in impedance and propagation characteristics. Between wordline segments 11, storage cells 10 are attached to the wordline, which are shown as dummy cells with both bitlines connected to the positive power supply rail (V_(DD)), but in a production circuit may be actual storage cells 10 connected to bitlines connected to suitable data circuits. Since, in the test methods described below, storage cells 10 will remain disabled, it is not necessary to connect storage cells 10 to bitlines or supply them with data.

The end of the wordline in the row circuit of FIG. 1A is connected to the input of a sense circuit 12 in accordance with an embodiment of the present invention. Sense circuit 12 provides a sense output signal Sense Out that accurately reflects that actual state change in a cell identical to storage cells 10, if there were a storage cell connected in place of sense circuit 12. Variations in the delay for each state change direction of sense output signal Sense Out for operating condition variations such as changes in V_(DD) or V_(OD) reflect changes in the internal access delay of storage cells 10 as well as writeability of storage cells 10. Absolute delay of output signal Sense Out can be determined with respect to a reference row circuit, as shown in FIG. 1B. The reference row circuit is identical to the test row circuit of FIG. 1A, but rather than sense circuit 12, an inverter I1 receives the wordline signal at the end position and provides a buffered output signal Ref Out. Output signal Sense Out can be compared directly with output signal Ref Out, or ring oscillators can be constructed with test row circuits as depicted in FIG. 1A and reference row circuits as depicted in FIG. 1B and their oscillating frequencies compared to determine the delay difference due to the access delay of the sense circuit 10, which is the delay from the arrival of the wordline transition at the storage cell to the change in state within the storage cell, a value that cannot be typically measured in an actual storage cell circuit. By cascading a large number of rows and optionally forming a ring oscillator, the overall delay can be multiplied by the number of rows, increasing the potential resolution of the measurement, since a single delay is on the order of picoseconds in present-day storage cell technology.

Referring now to FIG. 2, details of sense circuit 12 of FIG. 1A is shown in accordance with an embodiment of the invention. Sense circuit 12 includes at least one access detection cell 20A, which is almost identical to an actual storage cell 10. In the depicted embodiment, the type of storage cell 10 is 6T, with a pair of cross-coupled inverters having input/output terminals connected to a pair of bitline pass transistors, a type of storage cell that is well-known in the art. However, in the present invention, sensing of a access transition is provided in access detection cell 20A by coupling the output of the inverter formed by transistors P11 and N11 to the gate of N-channel transistor N10, but not to the gate of P-channel transistor P11. The gate of P-channel transistor P10 is connected to the wordline signal WL, rather than the output of the inverter formed by transistors P11 and N11. Access detection cell 20A circuit is otherwise configured as a 6T storage cell. The access detection cell 20A passgate transistors N12 and N13 are connected to transistors P12 and N14, which simulate bitline write drivers and could alternatively be supplied by actual bitlines with write driver circuits. The output of access detection cell 20A is taken from the output of the inverter formed by transistors P11 and N11, and provides the gate input to transistor N21B, which causes the falling direction transition of the Sense Out signal when transistor N21B is activated.

The operation of access detection cell 20A is such that prior to access detection cell 22A being enabled, wordline signal WL is at a low voltage level and transistor P10 is conducting, forcing the input of the inverter formed by transistors P11 and N11 to be at a high voltage level (V_(DD)). When wordline signal WL transitions from low voltage (ground) to high voltage (V_(OD)), pass transistors N12 and N13 in access detection cell 20A are enabled, forcing the input of the inverter formed by transistors P11 and N11 to ground, which causes the inverter output to rise, turning on transistor N10. Transistor N10 turns off transistor N21, previously enabled by the wordline signal WL applied to transistor N20A, which coupled a pre-charge circuit 22A that pulls up the gate of transistor N21 to duplicate the conditions that appear on wordlines of storage cells 10. Thus the rising transition at the output of transistor N21 is reflective of the end of the total state change within access detection cell 20A under actual loading and operating conditions of storage cells 10.

The above-described action of access detection cell 20 can be viewed as a one-shot “delay” imposed on the gate of transistor N21 with respect to the alternative connection of wordline signal WL to the input of inverter I1 as in the reference row circuit of FIG. 1B. The “delay” is that of a state change due to an access to access detection cell 20A. In order to increase the effective delay and/or difference of a ring oscillator period as between the reference row circuit of FIG. 1B and the test row circuit of FIG. 1A, another optional access detection cell 20B, along with another optional pre-charge circuit 22B and associated pass transistor N20B can be added to further delay the falling transition of the Sense Out signal, by delaying the de-activation of transistor P21. When wordline signal WL is raised to a high-voltage level, access detection cell 20B holds transistor P21 on until the internal state of access detection cell 20B has changed. Otherwise, wordline signal WL can be connected directly to the gate of transistor P21.

Referring now to FIG. 3, details of a sense circuit in accordance with another embodiment of the invention are shown. The alternative sense circuit has a structure and operation similar to access detection cells 20A of FIG. 2, and therefore only differences between them will be described below. In the depicted embodiment, a single access detection cell 20C A, provides the Sense Out signal directly from the input of the inverter formed by transistors P11 and N11, omitting pre-charge circuit 22A and transistor N21 of access detection cell 20A of FIG. 2, and connecting a transistor P13 that simulates the loading that would otherwise be provided by the gate of transistor P10 in an ordinary cross-coupled inverter circuit. Therefore the timing of the Sense Out signal reflects that of an actual cell in the array.

Referring now to FIG. 4, details of wordline drive circuit 14 of FIG. 1A and FIG. 1B are depicted. A static logical AND gate AND30 receives an input signal that may be the address decode or clock/access strobe signal and activates wordline signal WL via a series of cascaded inverters I30-I32 that implement a wordline drive circuit. Inverters I31 and I32 are supplied from overdrive power supply rail V_(OD), which may be varied as part of the test, as mentioned above, to determine if access overdrive is required and an overdrive voltage level. While only one input of logical AND gate AND30 is provided with an input signal in the depicted circuit and the others are wired in an enabled configuration, it is understood that the other inputs can be connected to signals as provided in an operational array configuration, such as one input receiving a clock, another a write signal and the third an address decode signal.

Referring now to FIG. 5, details of an array circuit wired in a delay chain and optionally a ring oscillator are depicted. As shown, each row circuit is implemented as shown in FIG. 1A, but the wordline driver circuits 14 and sense circuit 12 are at opposite physical ends of the wordlines for alternate storage array rows. Since the logical sense from the input of wordline driver 14 to the output of sense circuit 12 is a net inversion, either an odd number of rows should be connected to form a ring oscillator via optional feedback path FBK or another inversion must be added to the chain, for example, logical NAND gate NAND40 provides such an inversion, along with an enable input EN for activating oscillation. Multiple sub-arrays within a large array may also be connected in the ring or delay chain, or alternatively a reference ring may be implemented in one sub-array and the test ring in another.

Referring now to FIG. 6A and FIG. 6B, operation of the test row circuit of FIG. 1A is illustrated as simulation results in a time-voltage diagram. In FIG. 6A, wordline signal WL is shown as waveform 40. In response to the arrival of the rising edge of WL at the sense circuit 12, depicted as waveforms 41, the internal state of access detection cell 20A is shown as waveform 42 as presented to the gate of transistor N21A. Waveform 43 shows the output of sense circuit 12 and the difference in delay between the rising edge of waveform 40 and the falling edge of waveform 43 and the delay through the reference row circuit of FIG. 1B (not shown) yields the wordline-to-cell access delay. FIG. 6B shows the voltage of the internal node with no overdrive as waveform 44, which is one threshold voltage below V_(DD) during most of the write interval and waveform 45 again shows the output of sense circuit 12. If overdrive were required for writeability of storage cells 10 waveforms 44 and 45 could show no transition due to non-writeability at V_(OD)=V_(DD), a condition that can occur when the threshold voltage of pass transistors (e.g., transistors N12 and N13 of FIG. 2) is too high.

Referring now to FIG. 7, a VLSI wafer test system, in which methods according to an embodiment of the present invention are performed, is depicted. A wafer tester 50 includes a boundary scan unit 50A for providing stimulus to and retrieving data from a die 52A on a wafer under test 52 via a probe head 53 having electrical test connections to die 52A. Wafer tester 50 includes a frequency or delay measurement unit 50C, that evaluates a frequency of the ring oscillator or delay implemented by the test row and reference row of storage cells 10 in conjunction with wordline drivers 14 and sense circuit 12. Wafer tester 50 also includes a programmable power supply 50B for supplying power supply rail voltages V_(DD) and V_(OD) so that the overdrive and storage cell supply voltage can be varied during testing.

A workstation computer 58, having a processor 56 coupled to a memory 57, for executing program instructions from memory 57, wherein the program instructions include program instructions for receiving data from wafer tester 50 and/or circuits within wafer 52 in accordance with an embodiment of the present invention, is coupled to wafer tester 50. Generally the methods of the present invention either enable the reference and test ring counters, count their frequency of oscillation, subtract the results and divide by the number of rows in the rings to obtain the true access delay. Alternatively, a similar delay measurement is performed by stimulating the reference and test delay chain, measuring the delay times and subtracting the results, and dividing by the number of rows. Counters may be included within the die circuits to count the frequency or measure the delay, or the frequency/delay counters may be located in wafer tester 50. Program instructions obtain the counts from wafer tester 50 or read the counts from wafer 52, then process the counts to obtain the cell access delay and/or determine whether the cells are writeable under the currently-set operating conditions. The program instructions may be loaded from a storage media such as optical disc CD via a CD-ROM drive 55 or other suitable optical or magnetic/non-volatile memory drive. The data produced by embodiments of the present invention are collected from multiple ring oscillator or delay tests of storage cells 10 within dies 52A as one or more of the power supply voltages are varied by programmable power supply 50B The results of all of the measurements can then be evaluated to either change the design of the array or storage cells 10, determine whether fabrication process has deviated exceedingly from tolerable norms or to determine operational ranges such as power supply voltage tolerances and access cycle times.

Data from ring oscillator/delay line tests in accordance with embodiments of the invention are transferred to workstation computer 58 via wafer tester 50 and stored in memory 57 and/or other media storage such as a hard disk. Workstation computer 58 is also coupled to a graphical display 59 for displaying program output such as the results of memory tests described hereinafter. Workstation computer 58 is further coupled to input devices such as a mouse 54B and a keyboard 54A for receiving user input. Workstation computer 58 may be coupled to a public network such as the Internet, or may be a private network such as the various “intra-nets” and software containing program instructions for analyzing data produced by methods and circuits in accordance with embodiments of the present invention may be located on remote computers or locally within workstation computer 58. Further, workstation computer 58 may be coupled to wafer tester 50 by such a network connection.

While the system of FIG. 7 depicts a configuration suitable for sequential test of a plurality of dies on a wafer, the depicted system is illustrative and not limiting to the present invention. Probe head 53 may be a multi-die full wafer probe system, or may comprise multiple probe heads for simultaneously testing multiple wafers on a single or multiple die basis. Additionally, while boundary data retrieval and stimulus is illustrated, the techniques of the present invention may also be applied to other interfaces available to probe wafer 52, or applied to circuits implemented in fully functional dies where data extraction is performed over a serial or parallel bus or other interface.

While the invention has been particularly shown and described with reference to the preferred embodiment thereof, it will be understood by those skilled in the art that the foregoing and other changes in form, and details may be made therein without departing from the spirit and scope of the invention. 

1. A test storage circuit, comprising: a plurality of identical storage cells forming a row having a common wordline select input connected to a wordline select signal; and an access detection cell connected to said wordline select signal and having a detect output responsive to at least one transition of a simulated access operation initiated by a pulse of said wordline select signal, wherein a transition of said detect output is indicative of completion of a state change of said at least one transition within said access detection cell and presents a probe-able output of said test storage circuit, whereby a access delay of one of said storage cells can be determined from a delay introduced by said access detection cell.
 2. The test storage circuit of claim 1, wherein said access detection cell does not retain a state of said simulated access operation after said pulse is terminated.
 3. The test storage circuit of claim 2, wherein said detect output represents a state of one of said wordline select signal and a logical inversion of said wordline select signal as delayed in at least one transition of said wordline select signal by a time required to complete said state change.
 4. The test storage circuit of claim 2, wherein said access detection cell comprises: a first transistor having a gate connected to said wordline select signal and a first channel connection connected to a first power supply rail; an inverter having an input connected to a second channel connection of said first transistor; and a second transistor having a gate connected to an output of said inverter, a first channel connection connected to said input of said inverter and a second channel connection connected to a second power supply rail, wherein said first transistor causes said inverter to be set to a predetermined logical state when said pulse is not active, and wherein said second transistor forces said input of said inverter toward a voltage of said second power supply rail when said output of said inverter is forced toward a voltage of said toward first power supply rail, whereby said pulse causes simulation of one transition of a access operation to said access detection cell, in response to said pulse.
 5. The test storage circuit of claim 4, further comprising: a first pass transistor having a gate connected to said wordline select signal, a channel connection connected to said output of said inverter and a second channel connection coupled to one of said first power supply rail and an overdrive power supply rail; and a second pass transistor having a gate connected to said wordline select signal, a channel connection connected to said second channel connection of said first transistor and a second channel connection coupled to said second power supply rail, wherein said first and second pass transistor force a state of said output of said inverter and said input of said inverter, respectively, in response to said pulse.
 6. The test storage circuit of claim 5, further comprising an output circuit for receiving said output of said access detection cell, wherein said output circuit comprises: a first output transistor having a first channel connection connected to an output of said test storage circuit and a gate connected to said output of said inverter; a first output pass transistor having a gate connected to said wordline select signal, a first channel connection connected to a test pre-charge circuit, and a second channel connection connected to said gate of said first output transistor, wherein in response to said pulse, said first output transistor is activated by said first output pass transistor to change a state of said output of said access detection cell and in response to a completion of a state change of said inverter due to said pulse, said first output transistor is deactivated.
 7. The test storage circuit of claim 4, further comprising an output circuit for receiving said output of said access detection cell, wherein said output circuit comprises: a first output transistor having a first channel connection connected to an output of said test storage circuit and a gate connected to said output of said inverter; a first output pass transistor having a gate connected to said wordline select signal, a first channel connection connected to a test pre-charge circuit, and a second channel connection connected to said gate of said first output transistor, wherein in response to said pulse, said first output transistor is activated by said first output pass transistor to change a state of said output of said access detection cell and in response to a completion of a state change of said inverter due to said pulse, said first output transistor is deactivated.
 8. The test storage circuit of claim 1, further comprising a wordline driver having an output for providing said wordline select signal and having an overdrive power supply rail input distinct from power supply rails of said storage cells for providing said pulse having an amplitude substantially equal to said voltage of said overdrive power supply rail input.
 9. The test storage circuit of claim 1, wherein said plurality of storage cells and said access detection cell form a first row circuit, and wherein said test storage circuit further comprises multiple other row circuits identical to said first row circuit, and wherein said output of said access detection cell is coupled to an input of a next row circuit, whereby said delay is multiplied by a number of said rows to increase a resolution of measurement of said delay.
 10. The test storage circuit of claim 9, wherein said output of said access detection circuit of a last one of said multiple other row circuits is coupled to an input of a wordline driver of said first row circuit, whereby a ring oscillator is implemented having a frequency dependent on said delay introduced by said access detection cells of said row circuits.
 11. An access delay measurement circuit, comprising: a first transistor having a gate connected to a strobe input and a first channel connection connected to a first power supply rail; an inverter having an input connected to a second channel connection of said first transistor; and a second transistor having a gate connected to an output of said inverter, a first channel connection connected to said input of said inverter and a second channel connection connected to a second power supply rail, wherein said first transistor causes said inverter to be set to a predetermined logical state in response to an inactive state of said strobe input, and wherein said second transistor forces said input of said inverter toward a voltage of said second power supply rail when said output of said inverter is forced toward a voltage of said toward first power supply rail, whereby a pulse of said strobe input causes simulation of one transition of a access operation, in response to said pulse.
 12. The access delay measurement circuit claim 11, further comprising: a first pass transistor having a gate connected to said wordline select signal, a channel connection connected to said output of said inverter and a second channel connection coupled to one of said first power supply rail and an overdrive power supply rail; and a second pass transistor having a gate connected to said wordline select signal, a channel connection connected to said second channel connection of said first transistor and a second channel connection coupled to said second power supply rail, wherein said first and second pass transistor force a state of said output of said inverter and said input of said inverter, respectively, in response to said pulse.
 13. The access delay measurement circuit of claim 12, further comprising: a first output transistor having a first channel connection connected to an output of said test storage circuit and a gate connected to said output of said inverter; a first output pass transistor having a gate connected to said wordline select signal, a first channel connection connected to a test pre-charge circuit, and a second channel connection connected to said gate of said first output transistor, wherein in response to said pulse, said first output transistor is activated by said first output pass transistor to change a state of said output of said inverter and in response to a completion of said state change of said inverter due to said pulse, said first output transistor is deactivated.
 14. The access delay measurement circuit of claim 11, further comprising: a first output transistor having a first channel connection connected to an output of said test storage circuit and a gate connected to said output of said inverter; and a first output pass transistor having a gate connected to said wordline select signal, a first channel connection connected to a test pre-charge circuit, and a second channel connection connected to said gate of said first output transistor, wherein in response to said pulse, said first output transistor is activated by said first output pass transistor to change a state of said output of said inverter and in response to a completion of said state change of said inverter due to said pulse, said first output transistor is deactivated.
 15. A test storage array, comprising a plurality of row circuits each comprising a plurality of storage cells, wherein at least one of said plurality of row circuits includes a test access storage cell responsive to a wordline select signal of said at least one row circuit, wherein said plurality of row circuits is coupled together in a cascade of wordline select signals of each row from a first end of a wordline select signal conductor to a second end of said wordline select signal conductor, and wherein said test access storage cell introduces a delay in said wordline select signal of said at least one row circuit corresponding to a access delay of said storage cells.
 16. The test storage array of claim 15, wherein each of said plurality of row circuits includes a wordline driver circuit and a wordline sense circuit, located at said first end and said second end of said wordline select signal conductor, respectively, and wherein an input of said wordline driver circuit is provided from an output of a wordline sense circuit of a previous one of said plurality of row circuits, excepting a first one of said plurality of row circuits, whereby said delay is multiplied by a number of said plurality of row circuits.
 17. The test storage array of claim 16, wherein an output of said wordline sense circuit of a last one of said plurality of row circuits is coupled to an input of said wordline driver circuit of said first one of said plurality of row circuits, whereby a ring oscillator is formed having a frequency dependent on a length of said delay. 